I-2 Advancing HR-TEM and HR-STEM

Instrumentation and Techniques

The development of aberration correctors has transformed electron microscopy and led to new levels of resolution for imaging and spectroscopy. As a result it has become possible to reach sub-Angstrom resolution almost routinely. This has brought us closer to meeting some of the grand challenges in electron microscopy such as atomic resolution tomography or the imaging of individual point defects. At the same time, these advances have opened new scientific opportunities and uncovered new challenges in instrumentation, theory and technique. The sensitivity to radiation damage of both hard and soft matter demands new detectors and a greater range of operating voltages, the ability to measure atomic position with picometer precision presents challenges for atomistic simulations; and the need for high-resolution 3D information requires new stages, techniques, detectors and algorithms. This symposium will address recent advances in high resolution electron microscopy for materials science using many modes of operation – STEM, TEM, imaging, diffraction, spectroscopy, holography, tomography and their combination. Specific topics covered under this symposium include quantitative techniques for high-resolution imaging and simulation in TEM and STEM imaging, EDS and EELS spectroscopy. An important emphasis will be placed on instrumental advances such as aberration correctors, monochromators, detectors and guns, as well as the design and use of novel stages, improvements of existing instrumentation, and developments of new technologies. We encourage contributions that combine different modes of imaging and analysis with simulations based on atomistic modeling to push the limits of resolution.

Chairpersons:

Invited Speakers:
- David Smith, Arizona State University, USA
- Gianluigi Botton, McMaster University, Canada
- Rafal Dunin-Borkowski, Technical University of Denmark, Copenhagen, Denmark
- Sandra Van Aert, University of Antwerp, Belgium