M-1 Nanowires, Nanotubes and Particles

Materials Science and Nanotechnology

Electron microscopy has become an increasingly indispensible tool for structural characterization and local property measurement in nanoscience and nanotechnology and the study of energy related materials.  In this symposium, we focus on structure analysis and determination of inorganic nanostructured materials such as nanowires, nanotubes and nanoparticles using various conventional and advanced microscopy methods including aberration correction, high-resolution imaging, nano-probe diffraction, spectroscopy and chemical mapping, and in-situ microscopy.  Emphasis will be placed on structure-property relationship of these exciting nanostructured systems as well as their applications.  Topics of interest include, but are not limited to the followings:

• Inorganic nanostructured functional materials
• Caborn nanotubes and graphenes
• Metallic and semiconducting nanowires
• Nanoparticles for catalysis applications
• Nanostructures for energy generation, conversion and storage
• Nanostructured  materials for electronic and photonic applications
• Patterned structures for magnetic and spintronic devices

Papers on development of structural characterization methods and quantification in doping profiling, straining mapping, electron tomography and holography, in-situ indentation and biasing, and other property measurement are also encouraged.

Chairpersons:

Invited Speakers:
- Nobuo Tanaka, Nagoya Univerity, Japan
- Francis Ross, IBM, USA
- J. Yuan, University of York, UK
- L. D. Marks, Northwestern University, USA
- X. Q. Pan, University of Michigan, USA
- A. L. Bleloch, SuperSTEM, UK