M-19 In situ applications of microscopy            

Materials Science and Nanotechnology

In situ TEM is a powerful technique for observing microstructural changes in a specimen during application of heat, electric or magnetic fields and mechanical stress, and during exposure to a reactive environment. The evolution of individual nanostructures can be followed, reaction mechanisms can be determined, and the electronic and structural properties of individual nanostructures can be correlated. The use of UHV TEMs, with their clean specimen environment, further extends the possibilities of in situ experimentation, allowing clean surfaces to be prepared and characterised and growth to be carried out without the effects of atmospheric contamination. In this symposium, we aim to explore the applications of in situ and UHV TEM in materials science, physics and biology. We encourage submissions making use of in situ microscopy in these broad areas, as well as submissions that describe new in situ techniques.

Topics to be covered in this symposium include:

• Direct observations of the effects of temperature cycling (cooling and heating), magnetic and electric fields, and mechanical stressing on bulk and nanostructured materials;
• Correlation of electrical and structural measurements during in situ experiments;
• Studies of individual nanostructures using combinations of scanning probe and transmission microscopy;
• Environmental TEM for understanding catalysis and growth;
• Liquid cell microscopy, techniques and results;
• Chemical as well as structural analysis of surfaces, nanostructures, and thin films in situ;
• Quantification of ion and electron beam effects; and
• Holder and microscope development, including preparation chambers and vacuum issues.

Chairpersons:

Invited Speakers:
- Uli Dahmen, NCEM, Lawrence Berkeley National Lab (udahmen@lbl.gov)
- Niels de Jonge, Oak Ridge National Lab/Vanderbilt University (niels.de.jonge@Vanderbilt.Edu)
- Zhiwei Shan, Xi’an Jiaotong University (zwshan@mail.xjtu.edu.cn)